Diamond as Advanced Material for Scanning Probe Microscopy Tips
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2015-10-27 |
| Journal | Electroanalysis |
| Authors | Christine Kranz |
| Institutions | UniversitƤt Ulm |
| Citations | 15 |
Abstract
Section titled āAbstractāAbstract Synthetic diamond and conductive, doped forms of diamond are ideally suited materials for scanning probe microscopy tips due to their inherent physical, chemical, and mechanical properties. In particular for atomic force microscopy (AFM) and related techniques, which require a conductive tip in permanent contact to the sample surface, boronādoped diamond (BDD) is an excellent material. Only few examples have so far been demonstrated using boronādoped diamond microelectrodes as probes for scanning electrochemical microscopy (SEM) or AFMāSECM. This review focuses on the stateāofātheāart using diamondācoated SPM tips and conductive boronādoped diamond as probe material discussing advantages and disadvantages.