Application of boron-doped diamond film and ZnO layer in the Fabry-Pérot interferometer
At a Glance
Section titled “At a Glance”| Metadata | Details |
|---|---|
| Publication Date | 2016-09-02 |
| Journal | Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE |
| Authors | Daria Majchrowicz, W. Den, Małgorzata Szczerska |
| Institutions | Gdańsk University of Technology |
| Citations | 1 |
Abstract
Section titled “Abstract”In this article there have been presented the use of boron-doped diamond films for sensor applications. The low-finesse Fabry-Pérot interferometer working in the reflective mode has been implemented. Two kinds of reflective layers have been elaborated: boron-doped diamond thin films and zinc-oxide (ZnO) layer. Thin ZnO layers were deposited by Atomic Layer Deposition (ALD) on the face of a standard telecommunication single-mode optical fiber (SMF-28). Boron-doped diamond films were deposited using Microwave Plasma Enhanced Chemical Vapour Deposition (μPE CVD) system. Measurements were performed for various lengths of the air cavity in the reflective mode. The cavity length was varied from 0 μm to 600 μm in increments of 50 μm. Representative measured spectra obtained with a cavity length of 100 μm. The preliminary investigation of elaborated the low-coherence interferometers Fabry-Pérot have shown their ability for their application in sensors applications.