Single-grating Talbot imaging for wavefront sensing and x-ray metrology
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2017-09-07 |
| Authors | Walan Grizolli, Xianbo Shi, Lahsen Assoufid, Tomasz KoĹodziej, Yuri Shvydâko |
| Institutions | Argonne National Laboratory |
| Citations | 13 |
Abstract
Section titled âAbstractâSingle-grating Talbot imaging relies on high-spatial-resolution detectors to perform accurate measurements of X-ray beam wavefronts. The wavefront can be retrieved with a single image, and a typical measurement and data analysis can be performed in few seconds. These qualities make it an ideal tool for synchrotron beamline diagnostics and in-situ metrology. The wavefront measurement can be used both to obtain a phase contrast image of an object and to characterize an X-ray beam. In this work, we explore the concept in two cases: at-wavelength metrology of 2D parabolic beryllium lenses and a wavefront sensor using a diamond crystal beam splitter.
Tech Support
Section titled âTech SupportâOriginal Source
Section titled âOriginal SourceâReferences
Section titled âReferencesâ- 2015 - Focusing Mirror for Coherent Hard X-Rays
- 2014 - Development of single grating x-ray Talbot interferometer as a feedback loop sensor element of an adaptive x-ray mirror system
- 2010 - X-ray interferometry with two-dimensional gratings