Numerical Modeling of Native Defects in CVD Grown Diamond Photodetectors
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2018-11-01 |
| Journal | 2018 IEEE Electron Devices Kolkata Conference (EDKCON) |
| Authors | Sarthak Mohapatra, Prasant Kumar Sahu, N.N. Murty |
| Institutions | Indian Institute of Technology Bhubaneswar, Indian Institute of Technology Tirupati |
| Citations | 1 |
Abstract
Section titled âAbstractâDiamond based photoconductors intended for use as radiation detectors are simulated in this work in SYNOPSYS© Sentaurus TCAD. Simulations are carried out by including the model of native defects for single-crystal and poly-crystal diamond detectors grown by CVD process. The models are validated by comparing the simulations with the reported experimental data. The explanation of the results in terms of the diamond band-gap and the comparative analysis of the dark currents of both the detectors have also been presented. The temperature dependant simulation is also presented to substantiate the developed model at high temperature.
Tech Support
Section titled âTech SupportâOriginal Source
Section titled âOriginal SourceâReferences
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