Characterisation of thin boron-doped diamond films using Raman spectroscopy and chemometrics
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2018-12-26 |
| Journal | Analytical Methods |
| Authors | Peter Knittel, Robert Stach, Taro Yoshikawa, Lutz Kirste, Boris Mizaikoff |
| Institutions | UniversitƤt Ulm, Fraunhofer Institute for Applied Solid State Physics |
| Citations | 17 |
Abstract
Section titled āAbstractāA non-destructive chemometric method to determine thickness and boron concentration of as-deposited, thin, heavily doped diamond films by Raman microscopy.