Enhanced radiation hardness and signal recovery in thin diamond detectors
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2019-02-01 |
| Journal | AIP Advances |
| Authors | N. Skukan, I. SudiÄ, M. Pomorski, Wataru Kada, M. JakÅ”iÄ |
| Institutions | Commissariat Ć lāĆnergie Atomique et aux Ćnergies Alternatives, Rudjer Boskovic Institute |
| Citations | 12 |
Abstract
Section titled āAbstractāUsing the advantage of the high spatial resolution of the RuÄer BoÅ”koviÄ Institute (RBI) ion microprobe, small areas of a thin membrane single crystal chemical vapor deposition (scCVD) diamond detector were intentionally damaged with a high-intensity 26-MeV oxygen ion beam at various fluences, producing up to ā¼1018 vacancies/cm3. The response of the detector was tested with the ion beam-induced charge technique (IBIC) using a 2-MeV proton beam as a probe. The signal amplitudes decreased down to approximately 50% of the original value at low electric fields (<10 V/Ī¼m) inside the detector. However, the increase of electric field to values of ā¼100 V/Ī¼m completely recovers the signal amplitude. The results presented herein can facilitate the development of true radiation hard particle detectors.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
Section titled āReferencesā- 2007 - Radiation hardness of diamond and silicon sensors compared [Crossref]
- 2007 - A review of ion beam induced charge microscopy [Crossref]