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6CCVD Research

High-Power RF Characterization of Diamond Schottky Barrier Diodes at X-band

At a Glance

Section titled ā€œAt a Glanceā€
MetadataDetails
Publication Date2020-08-01
AuthorsXenofon Konstantinou, Cristian J. Herrera-Rodriquez, Aaron Hardy, John D. Albrecht, T.A. Grotjohn
InstitutionsMichigan State University, Fraunhofer USA
Citations2

Abstract

Section titled ā€œAbstractā€

This work focuses on the unique high-frequency power-handling capabilities of diamond Schottky Barrier Diodes (SBDs). We demonstrate the design, fabrication, and large-signal RF characterization, via active Load/Source-Pull (L/S-P), of a SBD on single-crystalline diamond (SCD). This is the first time a fully-integrated RF SBD has been fabricated and characterized via high-power impedance matching. The SBD was developed on a p-/p+ boron-doped SCD wafer. Active L/S-P was performed at 10 GHz for an input power (Pin) of 34 dBm, attaining an output power (Pout) of 33.3 dBm, yielding a loss of 0.7 dB under matching conditions and an RF power density of 375 W/mm2. These RF power levels are higher than those available in the literature for SBDs and show that diode large-signal characterization via active L-P can potentially play a significant role in the design of multipliers, rectifiers, and detectors that aim to deliver high Pout without thermal degradation.

Tech Support

Section titled ā€œTech Supportā€

Original Source

Section titled ā€œOriginal Sourceā€

References

Section titled ā€œReferencesā€
  1. 2014 - Electrical Properties of Materials

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