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A Novel Ga 2 O 3 Superjunction LDMOS Using P-Type Diamond with Improved Performance

MetadataDetails
Publication Date2022-10-01
JournalECS Journal of Solid State Science and Technology
AuthorsMoufu Kong, Jiacheng Gao, Zeyu Cheng, Zewei Hu, Bingke Zhang
InstitutionsUniversity of Electronic Science and Technology of China, National Engineering Research Center of Electromagnetic Radiation Control Materials
Citations8

Gallium oxide (Ga 2 O 3 ) has drawn remarkable attention for next generation power electronics applications. However, the development of Ga 2 O 3 power devices is seriously restricted due to its inefficient p-type dopants and low thermal conductivity. In this article, a novel Ga 2 O 3 superjunction (SJ) LDMOS (laterally-diffused metal-oxide semiconductor) device with introduction of a p-type diamond layer in the drift region is proposed and numerical investigated. The drift region of the proposed Ga 2 O 3 device consists of n-type Ga 2 O 3 , Al 2 O 3 and p-type diamond, which is not only increases the breakdown voltage (BV) and reduces the specific on-resistance ( R on,sp ), but also improves thermal performance of the device. The simulation results show that the BV and R on,sp of the proposed device are 23.22 mΩ·cm 2 and 7000 V, which are improved by more than 82.3% and 133% compared with those the conventional gate-connected filed-plate Ga 2 O 3 lDMOS with a R on,sp of 131.43 mΩ·cm 2 and a BV of 3000 V, respectively. Moreover, the thermal performance of the proposed Ga 2 O 3 SJ LDMOS is also improved dramatically, although the power density of the proposed device is about 5.7 times higher than that of the conventional device.

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