Photoluminescence and Electrical Properties of n-Ce-Doped ZnO Nanoleaf/p-Diamond Heterojunction
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2022-10-26 |
| Journal | Nanomaterials |
| Authors | Qinglin Wang, Yu Yao, Xianhe Sang, Liangrui Zou, Shunhao Ge |
| Institutions | Ludong University, Liaocheng University |
| Citations | 8 |
| Analysis | Full AI Review Included |
Executive Summary
Section titled âExecutive SummaryâThis study successfully fabricated and characterized an n-Ce:ZnO Nanoleaf (NL)/p-Boron-Doped Diamond (BDD) heterojunction, demonstrating superior performance compared to undoped counterparts, particularly in high-temperature environments.
- Enhanced Optoelectronics: Ce doping significantly improved photoluminescence (PL) intensity and induced a pronounced blue shift in the UV emission peak (from 385 nm to 365 nm), shifting the deviceâs chromaticity coordinates toward the dark blue region.
- High Thermal Stability: The heterojunction exhibits excellent rectification characteristics and stable electrical performance up to 175 °C, making it suitable for harsh environment applications.
- Improved Rectification: The rectification ratio at ±8 V dramatically increased from 1.38 (25 °C) to 29.37 (175 °C), indicating superior high-temperature diode behavior.
- Reduced Operating Voltage: The turn-on voltage (Von) decreased with temperature, dropping from 0.6 V (25 °C) to 0.4 V (175 °C).
- Carrier Transport Mechanism: At high temperatures, the dominant carrier transport mechanism shifts from band-to-band tunneling (at room temperature) to thermionic emission, confirming the viability of the device structure for high-temperature operation.
- Material Structure: Ce:ZnO NLs were grown via a hydrothermal method, maintaining a hexagonal wurtzite structure, with nanoleaves averaging 1.6 ”m in length and 7.9 nm in thickness.
Technical Specifications
Section titled âTechnical Specificationsâ| Parameter | Value | Unit | Context |
|---|---|---|---|
| BDD Band Gap | 5.47 | eV | Intrinsic property |
| BDD Electron-Hole Mobility | 2400 | cm2/(V · s) | Intrinsic property |
| BDD Carrier Concentration | 1.46 x 1018 | cm-3 | Measured via Hall effect |
| BDD Resistivity | 1.09 x 10-1 | Ω cm | Measured via Hall effect |
| Ce:ZnO NL Length | 1.6 | ”m | Average dimension |
| Ce:ZnO NL Thickness | 7.9 | nm | Average dimension |
| Ce Content (wt%) | 0.20 | wt% | EDS analysis of Ce:ZnO NLs |
| UV Emission Peak (Doped) | 365 | nm | n-Ce:ZnO NL/p-BDD (Blue Shifted) |
| UV Emission Peak (Undoped) | 385 | nm | n-ZnO/p-BDD |
| Turn-on Voltage (175 °C) | 0.4 | V | n-Ce:ZnO NL/p-BDD heterojunction |
| Turn-on Voltage (25 °C) | 0.6 | V | n-Ce:ZnO NL/p-BDD heterojunction |
| Rectification Ratio (175 °C) | 29.37 | Ratio (at ±8 V) | Significant high-temperature performance |
| Rectification Ratio (25 °C) | 1.38 | Ratio (at ±8 V) | Room temperature performance |
| Ideal Factor (n) (175 °C) | 4.61 | Dimensionless | Decreases with temperature |
| Ideal Factor (n) (25 °C) | 6.72 | Dimensionless | High value indicates tunneling/defects |
| Injection Efficiency (a) (175 °C) | 0.57 | V-1 | Moderate forward voltage (Region II) |
Key Methodologies
Section titled âKey MethodologiesâThe fabrication involved two main steps: BDD film preparation and Ce:ZnO Nanoleaf growth via a hydrothermal method.
-
p-BDD Film Preparation:
- Method: Hot Filament Chemical Vapor Deposition (HFVVD).
- Thickness: Approximately 4 ”m.
-
ZnO Seed Layer Deposition:
- Method: Magnetron sputtering onto the BDD films.
- Thickness: Approximately 20 nm.
-
n-Ce:ZnO NL Hydrothermal Synthesis:
- Precursor Solution Components:
- Zinc acetate dihydrate (Zn(CH3COO)2 · 2H2O): 0.2 M
- Cerium nitrate hexahydrate (Ce(NO3)2 · 6H2O): 11 mM
- Hexamethylenetetramine (CH2)6N4): 3 mM
- Anhydrous ethanol.
- pH Adjustment: NaOH was added until the precursor solution reached pH 10.
- Growth Conditions: The solution was transferred to an autoclave and treated at 150 °C for 24 hours.
- Post-Processing: Rinsed repeatedly with absolute ethanol for 5 minutes and dried at room temperature (RT).
- Precursor Solution Components:
-
Characterization Techniques:
- Morphology: Scanning Electron Microscopy (SEM).
- Elemental Composition: Energy-Dispersive X-ray Spectroscopy (EDS) and X-ray Photoelectron Spectroscopy (XPS).
- Crystalline Structure: X-ray Diffractometry (XRD) (Cu Kα radiation).
- Optical Properties: Photoluminescence (PL) spectroscopy (325 nm excitation).
- Electrical Performance: Keithley 2400 source meter for Current-Voltage (I-V) measurements (25 °C, 100 °C, 175 °C).
Commercial Applications
Section titled âCommercial ApplicationsâThe n-Ce:ZnO NL/p-BDD heterojunction, leveraging the chemical stability and high thermal conductivity of diamond combined with the tunable optical properties of Ce-doped ZnO, is highly valuable for specialized optoelectronic devices operating under extreme conditions.
- Harsh Environment Optoelectronics:
- High-temperature sensors and detectors (e.g., automotive, aerospace, industrial monitoring).
- Radiation-resistant devices (due to BDDâs inherent radiation hardness).
- High-Power Electronics:
- Rectifiers and diodes requiring stable operation at elevated temperatures (up to 175 °C and potentially higher).
- UV Light-Emitting Devices (LEDs):
- Fabrication of dark blue region LEDs, utilizing the enhanced and blue-shifted UV emission achieved through Ce doping.
- Chemical and Gas Sensing:
- BDD/ZnO nanostructures are known for sensing applications; the high surface area of the NL morphology and the defect control via Ce doping could enhance sensitivity and stability.
View Original Abstract
The n-type Ce:ZnO (NL) grown using a hydrothermal method was deposited on a p-type boron-doped nanoleaf diamond (BDD) film to fabricate an n-Ce:ZnO NL/p-BDD heterojunction. It shows a significant enhancement in photoluminescence (PL) intensity and a more pronounced blue shift of the UV emission peak (from 385 nm to 365 nm) compared with the undoped heterojunction (n-ZnO/p-BDD). The prepared heterojunction devices demonstrate good thermal stability and excellent rectification characteristics at different temperatures. As the temperature increases, the turn-on voltage and ideal factor (n) of the device gradually decrease. The electronic transport behaviors depending on temperature of the heterojunction at different bias voltages are discussed using an equilibrium band diagram and semiconductor theoretical model.
Tech Support
Section titled âTech SupportâOriginal Source
Section titled âOriginal SourceâReferences
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