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Hall measurements on nitrogen-doped Ib-type synthetic single crystal diamonds at temperatures 550–1143 K

MetadataDetails
Publication Date2024-03-04
JournalApplied Physics Letters
AuthorsС.Г. Буга, Г. М. Квашнин, М. С. Кузнецов, Н. В. Корнилов, Nikolay V. Luparev
InstitutionsTechnological Institute for Superhard and Novel Carbon Materials, Moscow Institute of Physics and Technology
Citations5

Synthetic nitrogen-doped diamond single crystals have various high-tech applications, but their electronic properties have not been sufficiently studied. In this research, we investigated temperature dependencies in the range T = (550-1143) K of the electrical resistivity and Hall mobility in synthetic single-crystal Ib-type diamonds doped with nitrogen during growth. A series of experimental samples were cut from diamond crystals grown by temperature gradient high-pressure high-temperature (TG-HPHT) and chemical vapor deposition (CVD) methods. They contain (0.085-6.5) × 1019 cm−3 single substitutional nitrogen atoms (C-centers) as measured by optical spectrometry methods. The Hall mobility of free electrons decreases from 600 to 150 cm2 V−1 s−1 in the CVD grown sample with the lowest N content and from 300 to 100 cm2 V−1 s−1 in highly doped HPHT grown samples in the temperature range of 550-900 K. At T = (900-1100) K, the mobility decreases to 50 cm2 V−1 s−1 in highly doped samples. The activation energies of electrical conductivity Ea and impurity-to-band energies of nitrogen donors ED decrease with increasing N concentration in the ranges (1.55-1.32) and (1.63-1.33) eV, respectively. The lowest compensation ratio k ∼ 1% in the moderately doped CVD diamond is unique for n-type diamonds. Typical values of k in highly N-doped crystals are in the range of 10%-20%, facilitating the use of N-doped diamonds in durable high-temperature electronic devices.

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