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MoSe2xTe2–2x alloy for hydrogen gas detection

MetadataDetails
Publication Date2024-12-10
JournalSensors and Actuators A Physical
AuthorsG. Tabares, Raúl Magro, L. Vázquez, A. M. Fernandez Navarro, N. Gordillo

This study presents one of the first detailed investigation into the out-of-plane growth of two-dimensional MoSe2xTe2-2x for three distinct Se:Te compositions, yielding the samples MoSe0.46Te1.55, MoSe0.55Te1.45, and MoSe0.64Te1.35. Scanning electron microscopy reveals the morphological evolution, showcasing nanoflakes predominantly grown in a random out-of-plane orientation. Raman spectroscopy confirms the crystal structure of MoSe2xTe2-2x samples, with no detectable traces of MoO3 or MoO2 precursors. Distinctive peaks validate the presence of MoSe2xTe2-2x, while spectral shifts suggest at compositional variations. Conductive-Atomic Force Microscopy (C-AFM) was used to quantify current flow between a diamond-doped AFM tip and the sample. Additionally, the resistances of compositions MoSe0.46Te1.55, MoSe0.55Te1.45, and MoSe0.64Te1.35 were characterized, yielding median values of 108.0 Ω, 25.4 kΩ, and 240.0 kΩ, respectively, indicating diverse electrical properties associated with Se content. Notably, the sample with the highest Se content exhibits increased resistivity as anticipated, consistent with XRD spectra results. Finally, gas-sensing performance is evaluated by assessing electrical resistance variations before and after exposure to H2 gas at various temperatures, revealing significant changes indicative of enhanced charge flow upon H2 exposure

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