On the Origin of S-Shaped Current-Voltage Characteristics under Electric-Field Ionization of
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2025-02-09 |
| Journal | Radioelectronics Nanosystems Information Technologies |
| Authors | Miron S. Kagan, S. K. Paprotskiy, N. A. Khvalkovskiy, R. A. Khmelnitsky, J. Kolodzey |
Abstract
Section titled āAbstractāAnalytical calculations were performed to determine the conditions for the formation of S-shaped current-voltage characteristics in a semiconductor doped with attractive impurities, taking into account the reduction of the impurity barrier in an electric field due to the Frenkel-Poole effect. Experimental data are presented, and the absence of S-shaped behavior in the current-voltage characteristics of heavily compensated germanium and boron-doped diamond is explained.