Skip to content

On the Origin of S-Shaped Current-Voltage Characteristics under Electric-Field Ionization of

MetadataDetails
Publication Date2025-02-09
JournalRadioelectronics Nanosystems Information Technologies
AuthorsMiron S. Kagan, S. K. Paprotskiy, N. A. Khvalkovskiy, R. A. Khmelnitsky, J. Kolodzey

Analytical calculations were performed to determine the conditions for the formation of S-shaped current-voltage characteristics in a semiconductor doped with attractive impurities, taking into account the reduction of the impurity barrier in an electric field due to the Frenkel-Poole effect. Experimental data are presented, and the absence of S-shaped behavior in the current-voltage characteristics of heavily compensated germanium and boron-doped diamond is explained.