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Photoelectric Performance of Two-Dimensional n-MoS2 Nanosheets/p-Heavily Boron-Doped Diamond Heterojunction at High Temperature

MetadataDetails
Publication Date2025-05-09
JournalInternational Journal of Molecular Sciences
AuthorsDe-yu Shen, Changxing Li, Dandan Sang, Shunhao Ge, Qinglin Wang
InstitutionsLiaocheng University
AnalysisFull AI Review Included

The research details the fabrication and characterization of a high-performance, thermally stable n-MoS2 Nanosheets (NSs)/p-Heavily Boron-Doped Diamond (DBDD) heterojunction device.

  • Superior Thermal Stability: The device maintains typical rectification characteristics across a wide temperature range, from Room Temperature (RT) up to 180 °C, demonstrating excellent thermal stability for harsh environments.
  • Optimal Performance Point: Maximum rectification ratio (8.11 x 106) and minimum reverse saturation current (5.18 x 10-9 A) are achieved at 100 °C, identifying this as the optimal operating temperature for forward rectifier diode performance.
  • Degenerate Doping Advantage: Compared to heterojunctions using lightly B-doped diamond, the DBDD device shows a massive improvement, increasing the rectification ratio by 7.64 x 106 times at 100 °C due to enhanced carrier injection and tunneling.
  • Zener Diode Transition: The electrical transport mechanism transforms into Zener diode behavior when the temperature exceeds 140 °C, indicating potential for high-temperature voltage regulation.
  • Transport Mechanism: Carrier transport is dominated by Fowler-Nordheim (F-N) tunneling at high temperatures, driven by Fermi level shifting and the weakening of carrier interband tunneling injection.
  • Optoelectronic Potential: The device exhibits Photoluminescence (PL) in the yellow-light region (CIE 0.492, 0.505) and Electroluminescence (EL) in the red-light region (CIE 0.309, 0.694).
  • Fabrication: MoS2 NSs (96 nm thick) were synthesized via the sol-gel method and deposited onto HFCVD-grown p-DBDD films (carrier concentration 5.8 x 1021 cm-3).
ParameterValueUnitContext
Maximum Rectification Ratio8.11 x 106DimensionlessAchieved at 100 °C
Minimum Reverse Saturation Current5.18 x 10-9AAt 100 °C
Zener Diode Transition Temperature> 140°CElectrical transport behavior change
Ideality Factor (n) Range8.82 - 9.73DimensionlessStable range from RT to 180 °C
DBDD Carrier Concentration5.8 x 1021cm-3p-type heavily doped
DBDD Resistivity1.05 x 10-3Ω cmMeasured via Hall test
DBDD Mobility6.8cm2 V-1 s-1Measured via Hall test
MoS2 NS Thickness96nmMeasured via AFM
MoS2 NS Lateral Size1.1”mAverage size
PL Emission Coordinates(0.492, 0.505)CIEYellow-light emission
EL Emission Coordinates(0.309, 0.694)CIERed-light emission
Conduction Band Offset (∆EC)3.8eVAnderson Model calculation
Valence Band Offset (∆EV)0.37eVAnderson Model calculation
Optimal Forward Current (6 V)0.167AAt RT

The device was constructed by combining a heavily boron-doped diamond (DBDD) substrate with two-dimensional n-MoS2 nanosheets (NSs).

  1. DBDD Film Preparation (HFCVD):

    • DBDD films were grown on a silicon wafer using Hot-Filament Chemical Vapor Deposition (HFCVD).
    • The gas mixture included H2 and CH4.
    • The boron source was liquid trimethyl borate ((CH3O)3B), introduced via H2 flow, with flow rate control used to achieve the heavily doped (degenerate) state.
    • The resulting DBDD film was cleaned with ethanol and deionized water.
  2. MoS2 Nanosheet Synthesis (Sol-Gel Method):

    • Precursors: Ammonium heptamolybdate tetrahydrate ([(NH4)6Mo7O24 · 4H2O]) was used as the Mo source, thioacetamide (CH3CSNH2) as the S source, and C14H23N3O10 as the chelating agent.
    • Sol Formation: The mixture was dissolved in 8 mL of deionized water and stirred continuously for one hour.
  3. Heterojunction Fabrication:

    • Deposition: The sol was dropped onto the DBDD film and deposited using spin coating, accelerating from 0 to 3000 rpm within 56 s.
    • Curing: The coating was cured at 60 °C for 5 minutes.
    • Thickening: A second identical deposition was performed.
    • Annealing: The bonded device was annealed at 400 °C for 4 hours to improve nanosheet quality.
  4. Electrode Configuration:

    • Cathode: Conductive Indium Tin Oxide (ITO) glass was placed in contact with the n-MoS2 NSs surface.
    • Anode: The p-DBDD film served as the positive electrode.
    • Contact: Silver paste and wires were used to connect the electrodes, separated by insulating adhesive.

This technology leverages the extreme properties of heavily doped diamond combined with 2D materials, making it highly relevant for specialized electronics.

  • High-Temperature Power Electronics: The exceptional thermal stability (up to 180 °C) and high rectification ratio are ideal for diodes and rectifiers used in high-power switching and conversion systems operating in extreme heat (e.g., industrial furnaces, aerospace systems).
  • Radiation-Hardened Devices: Diamond’s wide bandgap and chemical stability make the heterojunction suitable for optoelectronic devices and sensors deployed in high-radiation environments (e.g., nuclear facilities, space exploration).
  • Voltage Regulation and Protection: The observed Zener diode characteristics above 140 °C allow the device to function as a high-temperature voltage regulator or transient voltage suppressor in analog circuits.
  • Optoelectronic Emitters: The distinct PL (yellow) and EL (red) emission characteristics suggest applications in specialized high-temperature Light Emitting Diodes (LEDs) or integrated optical transmitters.
  • Non-Volatile Memory Erasure Technology: The strong dependence on Fowler-Nordheim (F-N) tunneling at high temperatures provides a mechanism relevant for developing advanced memory devices and erasure techniques.
  • High-Frequency/High-Speed Detectors: The combination of high carrier mobility in MoS2 and the robust diamond interface is beneficial for small signal detectors and high-speed switching applications.
View Original Abstract

Two-dimensional (2D) n-MoS2 nanosheets (NSs) synthesized via the sol-gel method were deposited onto p-type heavily boron-doped diamond (BDD) film to form a n-MoS2/p-degenerated BDD (DBDD) heterojunction device. The PL emission results for the heterojunction suggest strong potential for applications using yellow-light-emitting optoelectronic devices. From room temperature (RT) to 180 °C, the heterojunction exhibits typical rectification characteristics with good results for thermal stability, rectification ratio, forward current decrease, and reverse current increase. Compared with the n-MoS2/p-lightly B-doped (non-degenerate) diamond heterojunction, the heterojunction demonstrates a significant improvement in both its rectification ratio and ideal factor. At 100 °C, the rectification ratio reaches the maximum value and is considered an ideal high temperature for achieving optimal heterojunction performance. When the temperature exceeds 140 °C, the heterojunction transforms into the Zener diode. The heterojunction’s electrical temperature dependence is due to the Fermi level shifting resulting in the weakening of the carrier interband tunneling injection. The n-MoS2 NSs/p-DBDD heterojunction will broaden future research application prospects in the field of high-temperature consumption in future optoelectronic devices.

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