Measurement of microwave dielectric properties of low loss diamond film at Ka band using the split-cylinder resonator method
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2015-04-01 |
| Authors | Yanqing Liu, Minghui Ding, Jingjie Su, Jianmin She, Weizhong Tang |
| Institutions | University of Science and Technology Beijing |
Abstract
Section titled āAbstractāThe excellent properties of diamond films make it extremely attractive to apply the material in microwave vacuum devices, in particular in high-power conditions. However, low dielectric loss and small thickness (usual less than 0.5mm) of the material make it difficult to measure its microwave dielectric properties. In this paper, we describe construction of a split-cylinder resonator and application of the apparatus in measuring dielectric properties of a diamond film, together with a sapphire and a single-crystal quartz thin film sample at Ka-band. Results show that the split-cylinder resonator could meet the requirement to measure microwave dielectric properties of low loss thin film materials such as diamond films.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
Section titled āReferencesā- 2003 - Nondestructive relative permittivity and loss tangent measurements using a split-cylinder resonator
- 1994 - Dielectric properties of single crystals of Al 2 O 3, LaAlO 3, NdGaO 3, SrTiO 3, and MgO at cryogenic temperatures