Measuring the Magnetic Moment Density in Patterned Ultrathin Ferromagnets with Submicrometer Resolution
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2015-07-13 |
| Journal | Physical Review Applied |
| Authors | T. Hingant, Jean-Philippe Tetienne, L.âJ. MartĂnez, K. Garcia, D. Ravelosona |
| Institutions | Centre National de la Recherche Scientifique, Université Paris-Sud |
| Citations | 38 |
Abstract
Section titled âAbstractâWe present a new approach to infer the surface density of magnetic moments\n$I_s$ in ultrathin ferromagnetic films with perpendicular anisotropy. It relies\non quantitative stray field measurements with an atomic-size magnetometer based\non the nitrogen-vacancy center in diamond. The method is applied to\nmicrostructures patterned in a 1-nm-thick film of CoFeB. We report measurements\nof $I_s$ with a few percent uncertainty and a spatial resolution in the range\nof $(100$ nm)$^2$, an improvement by several orders of magnitude over existing\nmethods. As an example of application, we measure the modifications of $I_s$\ninduced by local irradiation with He$^+$ ions in an ultrathin ferromagnetic\nwire. This method offers a new route to study variations of magnetic properties\nat the nanoscale.