Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2015-09-18 |
| Journal | Japanese Journal of Applied Physics |
| Authors | Takeshi Hara, Y. Nojiri, Kenji Hanada, Tsuyoshi Yoshitake |
| Institutions | Saga University, Kyushu University |
| Citations | 8 |
Abstract
Section titled āAbstractāUltrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10 nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-KĪ± radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.