Combined X-ray absorption and X-ray diffraction under high pressure
At a Glance
Section titled “At a Glance”| Metadata | Details |
|---|---|
| Publication Date | 2016-07-02 |
| Journal | High Pressure Research |
| Authors | J. P. Itié, A. Polian, F. Baudelet, Cristian Mocuta, Dominique Thiaudière |
| Institutions | Life Science Institute, Centre National de la Recherche Scientifique |
| Citations | 5 |
Abstract
Section titled “Abstract”X-ray absorption spectroscopy (XAS) and X-ray diffraction (XRD) are two complementary structural techniques. Their combination improves the understanding of the effect of pressure on materials as illustrated by examples taken from studies on different types of materials (semiconductors, molecular solid, ferroelectric perovskite and gas mixture). The introduction of nanopolycrystalline diamonds anvils has extended XAS to high-energy edges with the possibility to use energy-scanning XAS beamlines where XRD can be performed in addition to XAS experiments.