The Use of Single-crystal CVD Diamond as a Position Sensitive X-ray Detector
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2017-01-01 |
| Journal | JACOW |
| Authors | Erich Griesmayer, Christopher Bloomer, P. Kavrigin, C. WeiĆ |
| Citations | 4 |
Abstract
Section titled āAbstractāSynchrotron light sources generate intense beams of X-ray light for beamline experiments, and the stability of these X-ray beams has a large impact on the quality of the experiments that can be performed. User experiments increasingly utilise micro-focus techniques, focusing the X-ray beam size to below 10 microns at the sample point, with beamline detectors operating at kHz bandwidths. Thus, there is a demand for non-invasive diagnostic techniques that can reliably monitor the X-ray beam position with sub-micron accuracy in order to characterise X-ray beam motion, at corresponding kHz bandwidths. Reported in this paper are measurements from single-crystal CVD diamond detectors, and a comparison with the previous-generation of polycrystalline CVD diamond detectors is offered. Single-crystal diamond is shown to offer superior uniformity of response to incident X-rays, and excellent intensity and position sensitivity. Measurements from single-crystal diamond detectors installed at Diamond Light Source are presented, and their use in feedback routines in order to stabilise the X-ray beam at the sample point is discussed.