Impedance study of undoped, polycrystalline diamond layers obtained by HF CVD
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2017-04-01 |
| Journal | Applied Physics A |
| Authors | K. Paprocki, K. Fabisiak, Anna Dychalska, MirosÅaw Szybowicz, Alina Dudkowiak |
| Institutions | Mahambet Otemiusly West Kazakhstan University, PoznaÅ University of Technology |
| Citations | 4 |
Abstract
Section titled āAbstractāIn this paper, we report results of impedance measurements in polycrystalline diamond films deposited on n-Si using HF CVD method. The temperature was changed from 170 K up to RT and the scan frequency from 42 Hz to 5 MHz. The results of impedance measurement of the real and imaginary parts were presented in the form of a Cole-Cole plot in the complex plane. In the temperatures below RT, the observed impedance response of polycrystalline diamond was in the form of a single semicircular form. In order to interpret the observed response, a double resistor-capacitor parallel circuit model was used which allow for interpretation physical mechanisms responsible for such behavior. The impedance results were correlated with Raman spectroscopy measurements.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
Section titled āReferencesā- 1994 - Synthesis diamond: emerging CVD science and technology
- 2005 - Progress in Chemometrics Research