High-sensitivity spin-based electrometry with an ensemble of nitrogen-vacancy centers in diamond
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2017-05-26 |
| Journal | Physical review. A/Physical review, A |
| Authors | Edward H. Chen, Hannah Clevenson, Kerry A. Johnson, Linh Pham, Dirk Englund |
| Institutions | Texas A&M University, MIT Lincoln Laboratory |
| Citations | 80 |
Abstract
Section titled āAbstractāWe demonstrate a spin-based, all-dielectric electrometer based on an ensemble\nof nitrogen-vacancy (NV$^-$) defects in diamond. An applied electric field\ncauses energy level shifts symmetrically away from the NV$^-$ās degenerate\ntriplet states via the Stark effect; this symmetry provides immunity to\ntemperature fluctuations allowing for shot-noise-limited detection. Using an\nensemble of NV$^-$s, we demonstrate shot-noise limited sensitivities\napproaching 1 V/cm/$\sqrt{\text{Hz}}$ under ambient conditions, at low\nfrequencies ($<$10 Hz), and over a large dynamic range (20 dB). A theoretical\nmodel for the ensemble of NV$^-$s fits well with measurements of the\nground-state electric susceptibility parameter, $\langle k_\perp\rangle$.\nImplications of spin-based, dielectric sensors for micron-scale electric-field\nsensing are discussed.\n