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High Performance ${beta}$ -Ga2O3 Nano-Membrane Field Effect Transistors on a High Thermal Conductivity Diamond Substrate

MetadataDetails
Publication Date2019-01-01
JournalIEEE Journal of the Electron Devices Society
AuthorsJinhyun Noh, Peide D. Ye, Sami Alajlouni, Marko J. Tadjer, James C. Culbertson
InstitutionsUnited States Naval Research Laboratory, Purdue University West Lafayette
Citations59

To suppress severe self-heating under high power density, we herein demonstrate top-gate nano-membrane &#x03B2;-gallium oxide (&#x03B2;-Ga<sub>2</sub>O<sub>3</sub>) field effect transistors on a high thermal conductivity diamond substrate. The devices exhibit enhanced performance, with a record high maximum drain current of 980 mA/mm for top-gate &#x03B2;-Ga<sub>2</sub>O<sub>3</sub> field effect transistors and 60% less temperature increase from reduced self-heating, compared to the device on a sapphire substrate operating under identical power density. With improved heat dissipation, &#x03B2;-Ga<sub>2</sub>O<sub>3</sub> field effect transistors on a diamond substrate are validated using an ultrafast high-resolution thermoreflectance imaging technique, Raman thermography, and thermal simulations.

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