Fourier-transform infrared spectroscopy for analysis of diamond materials of different origin
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2021-02-01 |
| Journal | IOP Conference Series Materials Science and Engineering |
| Authors | T. V. Martynova, N. I. Polushin, Š. I. Laptev, A L Maslov, Mariya Stanislavovna Shitareva |
| Institutions | National University of Science and Technology, Technological Institute for Superhard and Novel Carbon Materials |
| Citations | 2 |
Abstract
Section titled āAbstractāAbstract The study of impurity composition of diamond materials is an important element of their classification for use in various fields of science and technology. Many physical (thermal and electrical conductivity, optical purity), mechanical (hardness and strength) and aesthetic (color grade and clarity) properties of diamond depend on the presence of impurities in their structure; therefore, it is important to quickly and reliably determine each impurity in diamond. In this work, the method of FTIR spectroscopy is proposed as an express method for determining the impurity composition of diamonds. We examined three types of diamond materials: single crystal natural diamonds (before and after heat treatment), single crystal synthetic HPHT-diamonds and synthetic polycrystalline diamond CVD-films. We have established that the used technique allows to determine impurities in single crystals of natural and synthetic origin reliably and effectively, while the study of polycrystalline thin films is best performed using spectrophotometry.