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3-D Printed Microjet Impingement Cooling for Thermal Management of Ultrahigh-Power GaN Transistors

MetadataDetails
Publication Date2021-04-14
JournalIEEE Transactions on Components Packaging and Manufacturing Technology
AuthorsG. Zhang, James W. Pomeroy, MarĆ­a Elena Navarro, Hui Cao, Martin Kuball
InstitutionsUniversity of Bristol, University of Birmingham
Citations18

Future GaN-based radio frequency (RF) high-electron-mobility-transistors (HEMTs) can enable increased areal power dissipation by, for example, integrating GaN device layers with high thermal conductivity diamond substrates. To maximize the benefit of the ultrahigh-power-density electronic devices, improved package-level cooling methods are needed to prevent the package and heatsink becoming a thermal bottleneck. We demonstrate that 3-D printed polymeric microjet liquid impingement cooling can reduce the thermal resistance at the package level by ~60% with respect to GaN RF HEMTs mounted on conventional packaging.