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Experimental Observation of Pressure-Induced Superconductivity in Layered Transition-Metal Chalcogenides (Zr,Hf)GeTe4 Explored by a Data-Driven Approach

MetadataDetails
Publication Date2021-05-05
JournalChemistry of Materials
AuthorsRyo Matsumoto, Zhufeng Hou, Shintaro Adachi, Sayaka Yamamoto, Hiromi Tanaka
InstitutionsChinese Academy of Sciences, National Institute of Advanced Industrial Science and Technology
Citations9
AnalysisFull AI Review Included

This study reports the first experimental observation of pressure-induced superconductivity in the layered transition-metal chalcogenides (Zr,Hf)GeTe4, identified through a data-driven materials screening approach.

  • Core Discovery: Superconductivity was successfully induced in both ZrGeTe4 and HfGeTe4 single crystals under high pressure using a custom diamond anvil cell (DAC).
  • Maximum Tc: ZrGeTe4 achieved a maximum superconducting transition temperature (Tc) of 6.5 K at 57 GPa, while HfGeTe4 reached 6.6 K at 60 GPa.
  • Data-Driven Validation: The materials were selected from the Atomwork database based on theoretical predictions of a narrow band gap and high density of states (DOS) near the Fermi level, validating the high-throughput screening methodology.
  • Structural Transition: DFT calculations show the materials transition rapidly from a narrow-gap semiconductor (0.40 eV for ZrGeTe4) to a metallic state under compression (<10 GPa).
  • Deficiency Effect: HfGeTe4 exhibited Hf deficiency (Hf0.83GeTe4), resulting in a lower critical pressure (Pc) for superconductivity onset (8.1 GPa vs. 17.4 GPa for ZrGeTe4), suggesting carrier doping enhances the superconducting phase.
  • Measurement Technology: The high-pressure measurements relied on an originally designed DAC equipped with boron-doped diamond (BDD) electrodes and an undoped diamond (UDD) insulating layer.
  • Phase Coexistence: Both compounds exhibited multi-step superconducting transitions, indicating the likely coexistence of two distinct superconducting phases under high compression.
ParameterValueUnitContext
Max Tc (ZrGeTe4)6.5KAchieved under 57 GPa
Max Tc (HfGeTe4)6.6KAchieved under 60 GPa
Tc Zero Resistance (ZrGeTe4)2.4KObserved under 30.3 GPa
Tc Zero Resistance (HfGeTe4)2.0KObserved under 13.9 GPa
Onset Pressure Pc (ZrGeTe4)17.4GPaPressure where Tonset first appeared
Onset Pressure Pc (HfGeTe4)8.1GPaPressure where Tonset first appeared
Band Gap (ZrGeTe4)0.40eVAmbient pressure (DFT calculation)
Crystal StructureOrthorhombic (Cmc21)N/ADetermined by single crystal XRD
Lattice Constant a (ZrGeTe4)3.986(6)ARefinement result
Lattice Constant b (ZrGeTe4)15.95(3)ARefinement result
Hf Composition (Refined)Hf0.83GeTe4N/AIndicates Hf site deficiency
Zr 3d Spin-Orbit Splitting2.4eVBetween Zr4+ peaks (XPS analysis)
Hf 4f Spin-Orbit Splitting1.6eVBetween Hf4+ peaks (XPS analysis)
Resistance Exponent n (ZrGeTe4)1.96N/AAt 57 GPa (suggests electronic correlation scattering)
Resistance Exponent n (HfGeTe4)2.75N/AAt 86 GPa (suggests interband electron-phonon scattering)

The investigation involved computational screening, single crystal synthesis, comprehensive structural characterization, and specialized high-pressure electrical transport measurements.

  • Computational Screening and DFT:

    • Materials were screened from the Atomwork database, focusing on compounds exhibiting a narrow band gap and high DOS near the Fermi level, criteria favorable for pressure-induced superconductivity.
    • First-principles calculations (DFT using generalized gradient approximation) were used to model band structures and DOS under ambient pressure and 10 GPa, confirming the semiconductor-to-metal transition.
  • Single Crystal Synthesis:

    • Stoichiometric starting materials (Zr/Hf grains, Ge powders, Te chips) were sealed in evacuated quartz ampoules.
    • The ampoules were subjected to a multi-step heating process: 650 °C (20 hours) → 900 °C (50 hours) → slow cooling to 500 °C (50 hours) → furnace cooling.
    • The resulting samples were hair-like fiber single crystals.
  • Structural and Chemical Characterization:

    • Crystal Structure: Determined by single crystal X-ray diffraction (XRD) using Mo-Kα radiation and refined using SHELXT/ShelXle software.
    • Composition: Analyzed via Energy Dispersive X-ray Spectrometry (EDX).
    • Valence State: Estimated by X-ray Photoelectron Spectroscopy (XPS) on a surface milled by an Ar gas cluster ion beam (GCIB) to ensure intrinsic chemical state analysis.
  • High-Pressure Electrical Transport Measurement:

    • Device: An originally designed Diamond Anvil Cell (DAC) was employed.
    • Electrodes: Boron-doped diamond (BDD) served as the electrode material.
    • Insulation: An undoped diamond (UDD) layer was used to insulate the BDD electrodes from the metal gasket.
    • Pressure Medium: Cubic boron nitride (cBN) powder mixed with ruby manometer powder.
    • Pressure Calibration: Pressure was monitored using both ruby fluorescence peak shift and the Raman mode of the diamond anvil.
    • Measurement: Electrical resistance was measured using a four-terminal method (PPMS).

The research findings and methodologies have implications for several high-technology sectors, particularly those involving extreme conditions and advanced materials.

  • High-Pressure Research Equipment: The successful implementation of the custom DAC utilizing BDD electrodes and UDD insulation provides a proven, robust design for electrical transport measurements in high-pressure environments (up to 100 GPa).
  • Superconducting Electronics: The layered structure and observed Tc values position (Zr,Hf)GeTe4 as new candidates for fundamental research into low-temperature superconducting quantum interference devices (SQUIDs) or specialized interconnects.
  • Materials Informatics Software: The validation of the narrow band gap/high DOS screening criteria strengthens the commercial viability of materials informatics platforms designed for high-throughput discovery of novel functional materials, including superconductors and topological insulators.
  • 2D and Nano-Electronics: The layered, anisotropic, two-dimensional nature of these chalcogenides suggests potential use in next-generation nano-electronic devices, such as highly efficient field-effect transistors (FETs) or sensors, leveraging the improved surface adhesion properties of their zigzag structure compared to flat TMDs.
  • Diamond Material Technology: The use of BDD as a high-performance electrode in extreme pressure environments demonstrates a key application for advanced diamond materials in specialized scientific instrumentation and high-reliability sensors.
View Original Abstract

Layered transition-metal chalcogenides (Zr,Hf)GeTe${4}$ were screened out from database of Atomwork as a candidate for pressure-induced superconductivity due to their narrow band gap and high density of state near the Fermi level. The (Zr,Hf)GeTe${4}$ samples were synthesized in single crystal and then the compositional ratio, crystal structures, and valence states were investigated via energy dispersive spectrometry, single crystal X-ray diffraction, and X-ray photoelectron spectroscopy, respectively. The pressure-induced superconductivity in both crystals were first time reported by using a diamond anvil cell with a boron-doped diamond electrode and an undoped diamond insulating layer. The maximum superconducting transition temperatures of ZrGeTe${4}$ and HfGeTe${4}$ were 6.5 K under 57 GPa and 6.6 K under 60 GPa, respectively.