In situ nanoelectromechanical characterization of phase transformation in Si phononic crystal during nanoindentation
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2021-10-01 |
| Journal | APL Materials |
| Authors | Masaki Fujikane, Kouhei Takahashi, Naoki Tambo, Takashi Kozaki, Shijo Nagao |
| Institutions | Panasonic (Japan), The University of Osaka |
| Citations | 1 |
Abstract
Section titled âAbstractâThe size dependence of Youngâs modulus and the critical pressure for phase transformation from the diamond structure at ambient pressure to a metallic β-Sn structure at high pressure was studied in a Si phononic crystal. We used dynamic mechanical analysis and in situ electrical characterization with an electrically conducting diamond nanoindentation tip. Experiments on several phononic periodic sizes enabled us to establish that the Youngâs modulus and critical phase-transformation pressure decreased as the neck width (periodic structure) of the phononic crystal shrank. The finding enables us to understand the reduction in the thermal conductivity of the Si phononic crystal at the local neck between the nanoholes.