Scanning diamond NV center magnetometer probe fabricated by laser cutting and focused ion beam milling
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2021-12-28 |
| Journal | Journal of Applied Physics |
| Authors | Yuta Kainuma, Kunitaka Hayashi, Chiyaka Tachioka, Mayumi Ito, Toshiharu Makino |
| Institutions | Kyoto University, Japan Advanced Institute of Science and Technology |
| Citations | 5 |
Abstract
Section titled āAbstractāThe nitrogen-vacancy (NV) centers in diamond have been applied to scanning magnetometer probes combined with atomic force microscopy (AFM) to demonstrate nanometer-scale magnetic sensing and imaging. However, the scanning diamond NV center probe fabrication requires complicated processes including electron-beam lithography and photolithography. In this study, we introduce an alternative method to fabricate a scanning NV probe using laser cutting and focused ion beam (FIB) milling from a bulk diamond hosting an ensemble of NV centers. A few tens of micrometer-sized diamond pieces, cut by laser processing, were attached to the probe end of a quartz tuning-fork-based AFM. Then, it was fabricated into a few-micrometer-sized diamond NV center probe by using a donut-shaped milling pattern in the FIB processing to avoid damage to the diamond probe surface to degrade the NVā charged state at the tip apex. By using a home-built scanning NV magnetometer probe microscopy setup, an optically detected magnetic resonance was measured to detect stray magnetic fields demonstrating the imaging of a magnetic structure of approximately 5-Ī¼m periodicity from a magnetic tape. This study offers a method with a higher degree of probe-shape control for scanning NV probe that will broaden its application capabilities.