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Scanning gradiometry with a single spin quantum magnetometer

MetadataDetails
Publication Date2022-06-29
JournalNature Communications
AuthorsWilliam S. Huxter, Marius L. Palm, Miranda L. Davis, Pol Welter, Charles‐Henri Lambert
AnalysisFull AI Review Included
  • Core Innovation: Demonstration of Scanning Gradiometry, a technique that uses the mechanical oscillation of a single Nitrogen-Vacancy (NV) center in a diamond tip to up-convert static magnetic field gradients into measurable AC magnetic fields.
  • Sensitivity Gain: Achieves an order-of-magnitude improvement in sensitivity (~100 nT/sqrt(Hz)) for static field detection compared to standard DC NV magnetometry (~1-2 ”T/sqrt(Hz)).
  • Drift Suppression: The AC detection protocol strongly suppresses low-frequency magnetic field drifts, enabling stable, high-quality imaging over extended measurement periods.
  • Enhanced Resolution: Gradient fields (B1) decay faster with distance (proportional to x-2) than static fields (B0, proportional to x-1), resulting in more localized and sharper images.
  • Antiferromagnet Imaging: Successfully resolved nanotesla magnetic stray fields appearing above single atomic steps (0.227 nm height) in antiferromagnetic Cr2O3, a feat previously challenging for NV magnetometry.
  • Susceptometry Extension: Demonstrated nanoscale imaging of magnetic susceptibility in paramagnetic (Pd) and diamagnetic (Bi) micro-discs under ambient conditions.
ParameterValueUnitContext
AC Gradiometry Sensitivity~100nT/sqrt(Hz)Achieved using multi-period CPMG-2n detection.
DC Magnetometry Sensitivity (Best)1 to 2”T/sqrt(Hz)Standard static field imaging benchmark.
NV Center Oscillation Frequency (fTF)~32kHzQuartz tuning fork resonance frequency.
Oscillation Amplitude (xosc)10 to 70nmTypical range used for shear-mode oscillation.
NV Standoff Distance (d)70 to 130nmDistance between NV center and sample surface.
Laser Wavelength520nmOptical polarization and readout.
Microwave Pi-Pulse Duration~100nsUsed in CPMG sequences for spin manipulation.
Cr2O3 Single Atomic Step Height (h)0.227nmSmallest topographic feature resolved magnetically.
Fitted Cr2O3 Surface Magnetization (σz)2.1 ± 0.5”B/nm2Derived from fitting atomic step gradient data.
Palladium Film Thickness50nmUsed for nanoscale susceptometry demonstration.
Palladium Susceptibility (XPd)(6.6 ± 0.2) x 10-4UnitlessMeasured at 35 mT bias field (paramagnetic).
Bismuth Susceptibility (XBi)-(1.7 ± 0.1) x 10-4UnitlessMeasured at 33 mT bias field (diamagnetic).
  1. Scanning Probe Setup: A single NV center in a diamond tip is mounted onto a quartz tuning fork, enabling simultaneous magnetic sensing and Atomic Force Microscopy (AFM) position feedback.
  2. Shear-Mode Oscillation: The tuning fork is electrically driven to oscillate the NV center in a plane parallel to the sample (shear-mode) at its resonance frequency (fTF), with amplitudes typically ranging from 10 to 70 nm.
  3. Gradient Up-Conversion: The mechanical oscillation, x(t), converts the static spatial magnetic field gradient (dB/dx) into a time-varying AC magnetic field B(t), where the first harmonic amplitude B1 is proportional to xosc * (dB/dx).
  4. Synchronized AC Detection: The microwave pulse generation is synchronized with the tuning fork’s electrical drive using a lock-in controller.
  5. CPMG Quantum Protocol: AC magnetic fields are detected using sensitive dynamical decoupling sequences (Carr-Purcell-Meiboom-Gill, CPMG-n), which accumulate quantum phase (phi) over multiple oscillation periods (n).
  6. Phase Readout: The accumulated phase (phi) is measured via a four-phase readout technique based on the NV center’s photo-luminescence (PL) intensity, allowing the gradient field B1 to be computed.
  7. Calibration: The oscillation amplitude (xosc) and the trigger delay (t0) are calibrated in-situ using minimization schemes and phase maximization to ensure accurate gradient measurement and harmonic separation.
  8. Image Processing: Static field maps (B0) can be reconstructed from the measured gradient maps (B1) using k-space integration and weighted averaging, which significantly reduces noise and compensates for directional sensitivity.
  • Advanced Quantum Sensing: Provides a robust, high-sensitivity platform for next-generation scanning NV magnetometry, particularly for detecting weak, static magnetic fields under ambient conditions.
  • Spintronics and 2D Materials: Essential tool for imaging and quantifying weak magnetic phenomena in antiferromagnets (like Cr2O3), multiferroics, and 2D magnetic materials, including domain walls and spin spirals.
  • Nanoscale Current Mapping: High-resolution imaging of direct current distributions in complex microelectronic devices (e.g., graphene, topological insulators), crucial for studying hydrodynamic flow and transport phenomena.
  • Materials Characterization (Susceptometry): Enables nanoscale mapping of magnetic susceptibility in patterned metals, superconductors, and magnetic nanoparticles, extending traditional bulk susceptometry to the nanometer scale.
  • Defect and Interface Analysis: Capability to detect nanotesla fields associated with single atomic steps and topographic defects, providing critical insight into surface roughness and its influence on local magnetization and domain wall pinning.