Ion-induced optically active defect qubits in silicon carbide
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2023-07-19 |
| Authors | Shyama Rath, Gaurav Gupta, Shin Sato |
| Institutions | University of Delhi |
Abstract
Section titled āAbstractāOptically active point defects in the wide-bandgap semiconductors, diamond and SiC, are of interest as solid-state qubits for quantum photonics and metrology. The negatively charged silicon-vacancy (VSi) point defect in the 4H polytype of SiC consisting of a vacancy on a silicon site in SiC is a prominent defect qubit that has attractive features such as single-photon emission and long spin coherence times relevant for magnetic and temperature sensors, and single photon emitters. This work investigates ion irradiation protocols for the generation of defect qubits and their addressability by optical techniques of photoluminescence spectroscopy and optically detected magnetic resonance.