Mid-infrared assisted transport at the nano-junction between graphene and a doped-diamond scanning probe
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2024-02-01 |
| Journal | Photonics and Nanostructures - Fundamentals and Applications |
| Authors | Tommaso Venanzi, Maria Eleonora Temperini, Leonetta Baldassarre, Michele Ortolani, Valeria Giliberti |
| Institutions | Sapienza University of Rome, Italian Institute of Technology |
| Citations | 2 |
Abstract
Section titled āAbstractāWe report mid-infrared photoconductive atomic-force microscopy (AFM) of a graphene sheet with doped-diamond AFM probes illuminated with a quantum cascade laser. The diamond probe ensures high mechanical and electrical stability. We observe a prominent photoconduction at finite biases that we interpret as the overcoming of a potential barrier formed at the graphene-diamond junction by free carriers excited by mid-infrared photons (220 meV photon energy). Moreover, we observe a small photo-thermoelectric effect of graphene under zero applied bias. We demonstrate that the use of diamond AFM probes for mid-infrared photoconductive AFM has great potential to investigate the nanometric inhomogeneities of the Fermi level and of the work function across integrated semiconductor devices.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
Section titled āReferencesā- 2007 - Mapping local photocurrents in polymer/fullerene solar cells with photoconductive atomic force microscopy [Crossref]
- 2009 - Imaging the evolution of nanoscale photocurrent collection and transport networks during annealing of polythiophene/fullerene solar cells [Crossref]
- 2016 - Modulating optoelectronic properties of two-dimensional transition metal dichalcogenide semiconductors by photoinduced charge transfer [Crossref]
- 2006 - Conductance fluctuation and degeneracy in nanocontact between a conductive afm tip and a granular surface under small-load conditions [Crossref]
- 2016 - Electrical characterization of fib processed metal layers for reliable conductive-afm on zno microstructures [Crossref]
- 2023 - Solid platinum nanoprobes for highly reliable conductive atomic force microscopy [Crossref]
- 2010 - Preventing nanoscale wear of atomic force microscopy tips through the use of monolithic ultrananocrystalline diamond probes [Crossref]
- 2015 - Layer number dependence of mos2 photoconductivity using photocurrent spectral atomic force microscopic imaging [Crossref]
- 2023 - Mid-infrared photocurrent nano-spectroscopy exploiting the thermoelectric effect in graphene [Crossref]
- 2020 - Thermoelectric nanospectroscopy for the imaging of molecular fingerprints [Crossref]