Research on twist detection of electroplated diamond wire saw based on machine vision
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2024-08-23 |
| Authors | Chenxi Zhou, GE Pei-qi, Wenbo Bi, Yu-Kang Zhao, Jintao Zheng |
| Institutions | Shandong University |
Abstract
Section titled āAbstractāElectroplated diamond wire saw is widely used in photovoltaic, wafer, and other industries in the field of slicing processing, but in the sawing process the twist of the wire saw will have an impact on the quality of the slicing process and the life of the wire saw, to detect the twist of the electroplated diamond wire saw, the electroplated diamond wire saw twist detection method based on machine vision is proposed. A high frame rate CCD camera is used to acquire the surface image of the electroplated diamond wire saw, and the half-cylindrical image of the wire saw is expanded to mention the coordinates of its feature points, and the twist angle of the wire saw is calculated by the change of the position of the same feature point between the neighboring frames of the image. The results show that the maximum relative deviation of the twist angle of the electroplated diamond wire saw based on machine vision is 3.8%, and the relative deviation of the average value is 1.8%, which is capable of realizing high-precision, high-efficiency, and low-cost detection of the twist angle of the electroplated diamond wire saw, and providing a detection basis for controlling the twist of the electroplated diamond wire saw.