Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2025-05-01 |
| Journal | Journal of Physics Conference Series |
| Authors | Magdy M. Youssef, Alexey Zozulya, Mikhail Lyubomirskiy, G. Ansaldi, Jƶrg Hallmann |
Abstract
Section titled āAbstractāAbstract The availability of intense X-ray beams at megahertz repetition rate allows for new scattering and imaging experiments using the unique pulse train structure of the European X-ray Free-Electron Laser (EuXFEL). However, the resulting heat load can pose challenges for X-ray optics and potentially limit the efficiency. In this context, X-ray optics made of diamond emerge as a promising solution better suited for the extreme beam conditions at EuXFEL. In this article, we demonstrate a simple speckle analysis to determine the size of the focused beam in a caustic scan. The lenses are 1D planar diamond lenses and experiments were performed at the Materials Imaging and Dynamics (MID) station of EuXFEL. We find a minimum beam size of 630 nm and compare the speckle method with the more conventional method of wire scanning.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
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