Fabrication and characterization of physically-defined double quantum dots without unintentional localized states on highly-doped silicon substrate
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2015-06-14 |
| Authors | Yu Yamaoka, Tetsuo Kodera, Shunri Oda |
| Institutions | Tokyo Institute of Technology |
Abstract
Section titled āAbstractāWe fabricated double quantum dots (DQDs) and a single electron transistor (SET) as a charge sensor (CS) on highly-doped silicon-on-insulator (SOI) substrate. We observed Coulomb oscillations, and Coulomb diamonds in the SET, and estimated its charging energy to be ā¼15meV. We detected the change in the number of electrons of the DQDs with the CS, and observed a honeycomb-like charge stability diagram which is typical characteristics for DQDs. The regular shape of the charge stability diagram indicates that we succeeded in fabricating the DQDs without unintentional localized states.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal Sourceā- DOI: None