Study of low multiplicity electron source LEETECH with diamond detector
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2017-02-16 |
| Journal | Journal of Instrumentation |
| Authors | Viacheslav Kubytskyi, V. Krylov, P. Bambade, B. Cabouat, F. Wicek |
| Institutions | Centre National de la Recherche Scientifique, UniversitƩ Paris-Sud |
| Citations | 2 |
Abstract
Section titled āAbstractāIn this paper, we present experimental and numerical studies of the calibration of low-multiplicity electron source using signals from electrons incident on a diamond detector. The experiments were performed at the newly commissioned versatile LEETECH platform at the PHIL photoinjector facility at LAL. We show that with a single crystal CVD diamonds of 500 micrometers thickness, the energy losses from the first three electrons of 2.5-3 MeV are clearly resolved. The described technique can be used as a complementary approach for calibration of diamond detectors as well as for diagnostics of accelerated beam halos in a regime down to a few particles.