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Dynamic properties of diamond high voltage p–i–n diodes

MetadataDetails
Publication Date2017-03-16
JournalJapanese Journal of Applied Physics
AuthorsAboulaye Traoré, Akira Nakajima, Toshiharu Makino, Daisuke Kuwabara, Hiromitsu Kato
InstitutionsUniversity of Tsukuba, Japan Science and Technology Agency
Citations10

The switching characteristics of a diamond p+-i-n+ diode have been investigated to highlight the reverse recovery phenomenon, which is a consequence of the base conductivity modulation. The electrical transport within a diamond p+-i-n+ diode is still unclear, and the effectiveness of the base conductivity modulation remains the main concern. The measured turn-off waveforms of the diamond p+-i-n+ diode showed reverse recovery, thus confirming its bipolar nature. The diamond p+-i-n+ diode exhibits soft recovery and very fast switching behaviors (the recovery time was less than 200 ns). Moreover, according to the switching conditions, the reverse recovery in the diamond p+-i-n+ diode may induce a turn-off failure, which is ascribed to the well-known dynamic avalanche breakdown.