Charge transport properties of intrinsic layer in diamond vertical pin diode
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2017-05-22 |
| Journal | Applied Physics Letters |
| Authors | Takehiro Shimaoka, Daisuke Kuwabara, Asuka Hara, Toshiharu Makino, M. Tanaka |
| Institutions | National Institute of Advanced Industrial Science and Technology, The Graduate University for Advanced Studies, SOKENDAI |
| Citations | 8 |
Abstract
Section titled āAbstractāDiamond is hoped to be utilized in ultimate power electronic devices exhibiting ultra-high blocking voltages. For practical device formation, it is important to characterize the electric properties to precisely simulate carrier transport and to practically design optimum device structures. In this study, we experimentally evaluated the charge transport properties of intrinsic layers in diamond vertical pin diodes using alpha-particle induced charge distribution measurements. The charge collection efficiencies were 98.1 ± 0.6% for a {111} pin diode and 96.9 ± 0.6% for a {100} pin diode, which means that almost all generated charges are collected accordingly equivalent to conventional Silicon pin photodiodes. Mobility-lifetime (μĻ) products of holes were (2.2 ± 0.3) Ć 10ā6 cm2/V for {111} and (1.8 ± 0.1) Ć 10ā5 cm2/V for {100} diamond pin diodes.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
Section titled āReferencesā- 2008 - Physics and Applications of CVD Diamond [Crossref]