Toward Characterizing 3-D Microwave Field With Microscale Resolution Using Nitrogen-Vacancy Centers in Diamond
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2023-01-01 |
| Journal | IEEE Transactions on Instrumentation and Measurement |
| Authors | Ding Wang, Huan Fei Wen, Xin Li, Y. W. Jin, Wenyuan Hao |
| Institutions | North University of China |
| Citations | 11 |
Abstract
Section titled āAbstractāMeasurement of radio frequency chip microwave field is of great importance for the manufacture of precision instruments and the development of integrated circuits. In this paper, the characterization of chip surface three-dimensional (3D) microwave field distribution was realized with high-resolution based on diamond nitrogen-vacancy (NV) centers, and the field-image separation technique was developed to suppress the stray light noise caused by the reflection of the chip. The feasibility of the proposed method was verified by characterizing the planar microwave fields at different powers and the 3D microwave fields at different frequencies radiated by an antenna chip with a characteristic linewidth of 100 Ī¼m. The microwave field of chip radiation was accurately reconstructed with a vertical resolution of 30 Ī¼m, and the optimal NV detection sensitivity is 0.8 nT/Hz <sup xmlns:mml=āhttp://www.w3.org/1998/Math/MathMLā xmlns:xlink=āhttp://www.w3.org/1999/xlinkā>1/2</sup> . The results provide a new approach for antenna radiation detection and on-chip measurement based on quantum detection techniques.