A New Slurry for Photocatalysis-Assisted Chemical Mechanical Polishing of Monocrystal Diamond
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2023-06-20 |
| Journal | Machines |
| Authors | Junyong Shao, Yanjun Zhao, Jianhui Zhu, Zewei Yuan, Haiyang Du |
| Institutions | Northeastern University, Shenyang University of Technology |
| Citations | 9 |
| Analysis | Full AI Review Included |
Executive Summary
Section titled âExecutive SummaryâThis research introduces a novel Photocatalysis-Assisted Chemical Mechanical Polishing (PCMP) method utilizing a specialized slurry for achieving ultra-smooth surfaces on monocrystal diamond.
- Core Mechanism: The PCMP slurry uses titanium dioxide (TiO2) photocatalysts activated by UV light to generate highly oxidative hydroxyl radicals (·OH), which chemically react with the diamond surface (C*).
- Slurry Optimization: The slurry formulation requires a photocatalyst (P25 TiO2), an abrasive (Al2O3), an electron capture agent (H2O2), and a pH regulator (H3PO4) to maximize the oxidation-reduction potential (ORP).
- Optimal Catalyst: P25 TiO2 (a mixed crystal anatase/rutile form) demonstrated the most stable and effective photocatalytic activity compared to single-crystal TiO2 variants.
- Surface Quality Achievement: The process successfully reduced the surface roughness (Ra) of CVD diamond workpieces from an initial Ra 33.6 nm to an ultra-smooth Ra 2.6 nm after 8 hours of polishing using the P25 TiO2 slurry.
- Scratch Removal: PCMP effectively removed residual mechanical scratches left by prior lapping steps, yielding a smooth, atomic-level surface finish.
- Safety and Environment: The developed slurry is non-toxic and environmentally safer than traditional CMP slurries that rely on highly corrosive or toxic strong oxidants (e.g., CrO3, KMnO4).
Technical Specifications
Section titled âTechnical Specificationsâ| Parameter | Value | Unit | Context |
|---|---|---|---|
| Initial Surface Roughness (Ra) | 33.6 | nm | Before PCMP |
| Final Surface Roughness (Ra) | 2.6 | nm | After 8 h polishing with P25 TiO2 slurry |
| Best AFM Roughness (Ra) | 1.6 | nm | Measured after 8 h polishing with 5 nm TiO2 slurry |
| Polishing Time | 8 | h | Duration to achieve Ra 2.6 nm |
| Polishing Pressure | 1.09 | MPa | Applied pressure during PCMP |
| Rotational Speed | 60 | r/min | Polishing head speed |
| Optimal Photocatalyst | P25 TiO2 | N/A | Mixed crystal (80:20 anatase:rutile) |
| P25 Particle Size | ~25 | nm | Typical size of P25 TiO2 particles |
| TiO2 Bandgap (Eg) | 3.2 | eV | Required for photocatalysis |
| Required UV Wavelength | Less than 387.5 | nm | Wavelength needed to activate TiO2 |
| Slurry TiO2 Concentration | 0.5 | g / 100 mL | P25 TiO2 in water |
| Slurry Abrasive Concentration | 6 | g / 100 mL | Aluminum oxide (Al2O3) in water |
| Electron Capture Agent Dose | 3 | mL / 100 mL | H2O2 concentration |
| Maximum ORP Value | ~501 | mV | Achieved with 5 nm TiO2 + H2O2 + H3PO4 under UV |
Key Methodologies
Section titled âKey MethodologiesâThe Photocatalysis-Assisted Chemical Mechanical Polishing (PCMP) process involved specific preparation and operational steps:
-
Workpiece Preparation:
- CVD diamond workpieces were mounted onto the polishing head base using paraffin.
- Prior to PCMP, rough asperities were removed via stepwise mechanical lapping using diamond abrasives ranging from 3-6 ”m down to 0-0.5 ”m.
-
Slurry Formulation (PCMP Slurry Recipe):
- Photocatalyst: 0.5 g of P25 TiO2 particles (or 5 nm TiO2 for comparison) per 100 mL water.
- Abrasive: 6 g of aluminum oxide (Al2O3) per 100 mL water. Al2O3 was chosen as it cannot be oxidized by the slurry oxidant, isolating the chemical effect.
- Electron Capture Agent: 3 mL of H2O2 per 100 mL water. H2O2 was preferred over K2FeO4 due to its superior chemical stability.
- pH Regulator: Phosphoric acid (H3PO4) was used to maintain an acidic environment, which significantly boosts the slurryâs ORP and oxidizability.
-
PCMP Operation:
- Equipment: UNIPOL-1202 automatic lapping and polishing machine.
- Polishing Plate: Aluminum oxide plate.
- Mechanical Parameters: Polishing rotational speed was set to 60 r/min, and polishing pressure was maintained at 1.09 MPa.
- Chemical Activation: A Merc-1000 W mercury lamp (UV light source) was used to irradiate the slurry and the diamond surface, activating the TiO2 photocatalyst.
-
Slurry Characterization:
- Oxidizability Test: Oxidation-Reduction Potential (ORP) and conductivity were measured using an AZ86505 potentiometer.
- Photocatalytic Efficiency Test: Methyl orange degradation test was performed. The time required for the orange dye to fade (due to oxidation by ·OH radicals) indicated the slurryâs oxidizing power (60 min for complete degradation).
Commercial Applications
Section titled âCommercial ApplicationsâThe ability to achieve ultra-smooth, damage-free surfaces on large-area monocrystal diamond is critical for several high-technology sectors:
- Electronic Semiconductors: Diamond is a next-generation semiconductor material. Ultra-smooth polishing is essential for fabricating high-performance electronic devices, especially those requiring large-area wafers.
- Optical Windows and Components: Diamondâs wide-range transparency and high hardness make it ideal for optical windows (e.g., high-energy lasers, harsh environments). Surface roughness must be minimized to prevent scattering and maintain optical clarity.
- High-Fidelity Loudspeakers: Diamond diaphragms require extremely precise surface finishes to ensure optimal acoustic performance and fidelity.
- High-Energy Accelerators: Diamond components used in accelerators require high structural integrity and smooth surfaces to meet stringent operational criteria.
- Advanced Manufacturing (CMP/PCMP Slurries): The development of non-toxic, high-efficiency, and stable PCMP slurries provides a safer and more effective alternative to traditional chemical mechanical polishing formulations.
View Original Abstract
Diamond needs to have a perfectly smooth surface due to the growing requirements in the fields of electronic semiconductors, optical windows and high-fidelity loudspeakers. However, the polishing of diamonds is highly challenging due to their exceptional hardness and chemical stability. In this study, a new polishing slurry is prepared for the proposed photocatalysis-assisted chemical mechanical polishing (PCMP) approach to obtain an ultra-smooth surface for large-area diamond. The analyses and experimental findings revealed the significance of the photocatalyst, abrasive, electron capture agent and pH regulator as essential components of the PCMP slurry. TiO2 with a 5 nm pore size and P25 TiO2 possess improved photocatalysis efficiency. Moreover, diamond removal is smooth under the acidic environment of H3PO4 due to the high oxidation-reduction potential (ORP) of the slurry, and, during the methyl orange test, P25 TiO2 exhibits reasonable photocatalytic effects. Moreover, in 8 h, a smooth surface free of mechanical scratches can be obtained by reducing the surface roughness from Ra 33.6 nm to Ra 2.6 nm.
Tech Support
Section titled âTech SupportâOriginal Source
Section titled âOriginal SourceâReferences
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