Broadband anti-reflection coating with diamond and PTFE for terahertz detectors
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2023-11-26 |
| Authors | Jiameng Wang, Kangmin Zhou, Bowen Fan, Wei Miao, Wen Zhang |
| Institutions | Purple Mountain Observatory, University of Science and Technology of China |
Abstract
Section titled āAbstractāIn this paper, we present a wideband antireflection coating designed for high-resistivity silicon and alumina lenses used in cryogenic terahertz detectors. A dual-layer coating structure based on diamond and polytetrafluoroethylene (PTFE) films is employed to achieve high transmittance in a wide frequency range, the film thickness of diamond and PTFE has been precisely controlled by mature microwave plasma chemical vapor deposition (MPCVD) and thermal spraying technology. The transmittances of coated silicon sample was measured within the frequency ranges of 0.3-0.5 THz using the Quasi Optical Vector Network Analyzers (QO-VNA). The measured transmittance of the one side coated silicon sample accords well with the simulation results, which demonstrates the accuracy of the coating process. A remarkable transmittance level of up to 99% can be achieved by applying the AR coating to silicon lens according to the simulations. This wideband antireflection coating can be applied to cryogenic terahertz detectors, such as superconducting hot electron bolometer (HEB) detectors and superconducting kinetic inductance (KIDs) detectors.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
Section titled āReferencesā- 2009 - 2.52-THz scanning reflection imaging and image preprocessing
- 2022 - Lossless Matching Layer for Silicon Lens Arrays At 500 GHz Using Laser Ablated Structures
- 2018 - Preparation and Characterization of PTFE/ZrAlN/Ag/ZrAlN Films