Research on metrology method of surface magnetic field based on the nitrogen-vacancy center (NV) in diamonds
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2024-09-01 |
| Journal | Journal of Physics Conference Series |
| Authors | Jinglu Sun, Peiyan Zhang, Rui Ji, Xiangyang Zhang |
Abstract
Section titled āAbstractāAbstract This paper proposes a novel metrology method for surface magnetic fields based on the nitrogen-vacancy (NV) center in a diamond. A coplanar waveguide is used to calibrate the NV center, and its standard values are derived from its simulation results. This metrology method involves leveraging quantum NV scanning technology to capture the Optically Detected Magnetic Resonance (ODMR) spectrum and Rabi oscillation curves of the waveguide, and test data of the surface magnetic field of the coplanar waveguide are meticulously extrapolated through a rigorous fitting process. We compare the test data and simulation results to verify the accuracy of the metrology method. This method promises to enhance the fidelity of magnetic field distribution measurements on chip surfaces, thereby elevating the standards of chip testing accuracy for future applications.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
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