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Corrugated channel In<inf>0.8</inf>Ga<inf>0.2</inf>As quantum well transistors for low power logic applications

MetadataDetails
Publication Date2017-06-01
AuthorsJ. A. Smith, Michael Barth, Kai Ni, Mirco Cantoro, Dong‐Won Kim
InstitutionsPennsylvania State University, University of Notre Dame

In <inf xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;x&lt;/inf> Ga <inf xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;1−x&lt;/inf> As MOSFETs with superior carrier transport properties promise to deliver high current at reduced supply voltages [1-2]. Strained III-V quantum well FinFETs (QW-FF) have been investigated [3-4] as feasible pathways to low power logic. For sub-7 nm nodes, challenges in maintaining electrostatic integrity in FFs has led to the proposal of faceting the FF channel (corrugated channel) to produce diamond-shaped [7-8] electrically gate-all-around (eGAA) channels. In this work, we evaluate the impact of corrugating of channel width (Z <inf xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;eff&lt;/inf> ) in In <inf xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;0.8&lt;/inf> Ga <inf xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;0.2&lt;/inf> As QW transistors on effective drive current (I <inf xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;eff&lt;/inf> ) gain and short channel effect (SCE) improvement for 7nm node.