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MEASUREMENT OF PHONON TRANSPORT IN GaN-ON-SiC AND GaN-ON-DIAMOND HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) DEVICES

MetadataDetails
Publication Date2017-10-16
AuthorsRonggui Yang

Abstract : The objective of this project is to experimentally study the transient non-diffusive phonon transport in gallium nitride (GaN) based high electron mobility transistor (HEMT) devices. Using the ultrafast pump-probe thermoreflectance, we found that the measured thermal conductivity of the GaN substrate depends on the heating frequency and the metal thin film thickness. This novel phenomenon observed suggest that phonon transport in GaN would depend on both the structural and operating frequency.