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A GaN/Diamond HEMTs with 23 W/mm for Next Generation High Power RF Application

MetadataDetails
Publication Date2019-06-01
AuthorsWon Sang Lee, Kyungwon Lee, Seung Hyun Lee, Kevin Cho, Samuel K. Cho
Citations13

This work demonstrated a successful fabrication of 4ā€ GaN/Diamond HEMTs incorporated with Inner Slot Via Hole process. The RF device parameters were measured On-wafer Load pull measurement. The power density of 23.2 W/mm at Vds = 100 V is obtained at a wafer level at 2 GHz pulse power measurements.