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Germanium gate hydrogen-terminated diamond field effect transistor with Al2O3 dielectric layer

MetadataDetails
Publication Date2022-12-31
JournalFunctional Diamond
AuthorsMinghui Zhang, Wei Wang, Feng Wen, Fang Lin, Genqiang Chen
InstitutionsHebei Semiconductor Research Institute, Xi’an Jiaotong University
Citations8

Investigation of germanium gate hydrogen-terminated (H-terminated) diamond field effect transistor (FET) with Al2O3 dielectric layer has been successfully performed. The device demonstrates a normally-on characteristics, whose maximum drain-source current density, threshold voltage, maximum transconductance, on/off ratio, subthreshold swing, capacitance, carrier density, saturation carrier mobility, fixed charge density and interface state density are of āˆ’37.3 mA/mm, 0.22 V, 6.42 mS/mm, 108, 134 mV/dec, 0.33 μF/cm2, 9.83 Ɨ 1012 cmāˆ’2, 97.9 cm2/VĀ·s, 7.63 Ɨ 1012 cmāˆ’2 and 2.56 Ɨ 1012 cmāˆ’2Ā·eVāˆ’1, respectively. This work is significant to the development of H-terminated diamond FET.