Dielectric properties of diamond using an X-band microwave split dielectric resonator
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2024-01-25 |
| Journal | Carbon |
| Authors | Jerome A. Cuenca, Soumen Mandal, Jaspa Stritt, Xiang Zheng, James W. Pomeroy |
| Institutions | University of Bristol, Cardiff University |
| Citations | 5 |
Abstract
Section titled āAbstractāThis work presents an easy-to-use microwave split dielectric resonator (MSDR) for X-band dielectric measurements of free-standing unpolished poly-crystalline diamond (PCD). PCD grown with varying CH \n \n \n \n 4 \n \n \n /H \n \n \n \n 2 \n \n \n and O \n \n \n \n 2 \n \n \n / CH \n \n \n \n 4 \n \n \n /H \n \n \n \n 2 \n \n \n in the gas phase show stark differences in dielectric loss. Low microwave dielectric loss PCD is found for CH \n \n \n \n 4 \n \n \n /H \n \n \n \n 2 \n \n \n concentrations of less than 5% while PCD grown with O \n \n \n \n 2 \n \n \n show very high loss tangents. Vacuum annealing introduces non-diamond carbon (NDC) impurities which increases the loss, however, even after significant discolouration the loss is still lower than the O \n \n \n \n 2 \n \n \n grown PCD. The loss mechanism of O \n \n \n \n 2 \n \n \n grown PCD is likely due to a high concentration of grain boundaries and grain boundary hopping conduction mechanisms as opposed to high concentrations of NDC impurities.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
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