Stroboscopic x-ray diffraction microscopy of dynamic strain in diamond thin-film bulk acoustic resonators for quantum control of nitrogen-vacancy centers
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2024-08-07 |
| Journal | Physical Review Applied |
| Authors | Anthony J. DāAddario, Johnathan Kuan, Noah Opondo, Ozan Erturk, Tao Zhou |
| Institutions | Cornell University, Purdue University West Lafayette |
| Citations | 1 |
Abstract
Section titled āAbstractāBulk acoustic wave (BAW) resonators that generate dynamic lattice strain are important for applications such as filters, sensors, and quantum control, but there is a lack of measurements available to quantify the strain directly. This study uses stroboscopic X-ray diffraction microscopy with correlated optical measurements on an ensemble of nitrogen-vacancy center defects to measure the dynamic strain in a diamond BAW resonator. This unique approach allows for directly imaging BAW resonator strain to improve fabrication and performance and for directly measuring important parameters of quantum defects to improve quantum control.