Quantum Diamond Microscopy for Semiconductor Failure Analysis
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2025-02-01 |
| Journal | EDFA Technical Articles |
| Authors | Marwa Garsi, Andreas Welscher, Manuel Schrimpf, Bartu Bisgin, M. Hanke |
Abstract
Section titled âAbstractâAbstract Quantum diamond microscopy is an innovative nondestructive tool. This article describes detailed operations from a failure analystâs perspective, showing how the technique integrates into standard workflows. Case histories are included comparing its performance to established FA methods and highlighting QDMâs specific advantages.