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An Enhancement-Mode Hydrogen-Terminated Diamond Field-Effect Transistor With Lanthanum Hexaboride Gate Material

MetadataDetails
Publication Date2020-02-07
JournalIEEE Electron Device Letters
AuthorsWei Wang, Yanfeng Wang, Minghui Zhang, Ruozheng Wang, Genqiang Chen
InstitutionsXi’an Jiaotong University
Citations85

An enhancement-mode hydrogen-terminated diamond field-effect transistor (FET) is realized by using a low work function gate material, namely, lanthanum hexaboride (LaB <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;6&lt;/sub> ). The reason for the enhancement mode should be that the electrons in the LaB <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;6&lt;/sub> layer flow into the two-dimensional hole gas (2DHG) channel and compensate the holes, such that the channel is shut down. The threshold voltages (V <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;TH&lt;/sub> ) range from - 0.29 V to - 0.72 V with different gate lengths. The device with 2μm gate length shows a - 57.9 mA/mm maximum drain current density (I <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;DSmax&lt;/sub> ) at V <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;GS&lt;/sub> = - 5 V. The on/off ratio is around 9 orders of magnitude, with a subthreshold swing of 130 mV. Effective mobility (μ <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;eff&lt;/sub> ) as high as 195.4 cm <sup xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;2&lt;/sup> /V·s is obtained from the device. This technique reveals undamaged 2DHG characteristics, uncontaminated interface between LaB <sub xmlns:mml=“http://www.w3.org/1998/Math/MathML” xmlns:xlink=“http://www.w3.org/1999/xlink”&gt;6&lt;/sub> and aluminum gate metal, and a simple fabrication process, which will promote the development of enhancement diamond FETs.