Wide-field microwave magnetic field imaging with nitrogen-vacancy centers in diamond
At a Glance
Section titled āAt a Glanceā| Metadata | Details |
|---|---|
| Publication Date | 2025-03-24 |
| Journal | Journal of Applied Physics |
| Authors | Luca Basso, Pauli Kehayias, Jacob Henshaw, Gajadhar Joshi, Michael Lilly |
| Institutions | Center for Integrated Nanotechnologies, Sandia National Laboratories |
| Citations | 2 |
Abstract
Section titled āAbstractāNon-invasive imaging of microwave (MW) magnetic fields with microscale lateral resolution is pivotal for various applications, such as MW technologies and integrated circuit failure analysis. Diamond nitrogen-vacancy (NV) center magnetometry has emerged as an ideal tool, offering micrometer-scale resolution, millimeter-scale field of view, high sensitivity, and non-invasive imaging compatible with diverse samples. However, up until now, it has been predominantly used for imaging of static or low-frequency magnetic fields or, concerning MW field imaging, to directly characterize the same microwave device used to drive the NV spin transitions. In this work, we leverage an NV center ensemble in diamond for wide-field imaging of MW magnetic fields generated by a test device employing a differential measurement protocol. The microscope is equipped with a MW loop to induce Rabi oscillations between NV spin states, and the MW field from the device-under-test is measured through local deviations in the Rabi frequency. This differential protocol yields magnetic field maps of a 2.57 GHz MW field with a sensitivity of ā¼9 Ī¼T Hzā1/2 for a total measurement duration of T=357 s, covering a 340Ć340Ī¼m2 field of view with a micrometer-scale spatial resolution and a device-under-test input power dynamic range of 30 dB. This work demonstrates a novel NV magnetometry protocol, based on differential Rabi frequency measurement, that extends NV wide-field imaging capabilities to imaging of weak MW magnetic fields that would be difficult to measure directly through standard NV Rabi magnetometry.
Tech Support
Section titled āTech SupportāOriginal Source
Section titled āOriginal SourceāReferences
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